Inactive

***PLEASE CONTACT SHENISE TRUESDELL WITH ANY TECHNICAL QUESTIONS OR TO SUBMIT CAPABILITIES TO SHENISE.TRUESDELL@NASA.GOV National Aeronautics Space Administration (NASA) Marshall Flight Space Center (... ***PLEASE CONTACT SHENISE TRUESDELL WITH ANY TECHNICAL QUESTIONS OR TO SUBMIT CAPABILITIES TO SHENISE.TRUESDELL@NASA.GOV National Aeronautics Space Administration (NASA) Marshall Flight Space Center (MFSC) has a requirement for a field emission scanning electron microscope (FE-SEM) with energy dispersive spectroscopy (EDS) that is required to support the avionics failure analysis activities at MFSC for all agency programs and projects including, but not limited to the Space Launch Systems (SLS), International Space Station (ISS), and commercial partners such as SpaceX. JEOL USA, Inc. is the manufacturer of and only source available to provide the brand name product JSMIT700HRLA required in support of this effort. The product provides, without the use of beam deceleration or in-lens detectors, a thermal Schottky type field emission scanning electron microscope (FE-SEM) with high resolution of at least 1 nanometer (nm) at 20 kilovolts (kVs) using an in-chamber secondary electron detector and 1.8 nanometer (nm) at 15 kilovolts (kVs) in low vacuum mode including the ability to deliver >300 nanoamps (nA) of probe current with a minimum 3-year life span guaranteed. The FE-SEM provides variable magnification range from 5X to 600,000X. The system includes a probe current detector and a low vacuum secondary electron detector. The electron gun is positioned in the field of the first condenser lens to maximize the current generated into the probe. The system includes an aperture angle control lens (ACL) to minimize system anomalies and distortions and optimize the convergence angle to ensure optimum performance at all kilovolts (kVs) and probe currents. This FE-SEM is capable of both high vacuum and low vacuum modes providing the flexibility to study a wide variety of sample types. The FE-SEM includes a fully integrated EDS dry detector where FE-SEM image observation and EDS analysis are from the same software interface and the EDS is made by the same company as the FE-SEM manufacturer with a minimum 60 square millimeter window for best xray mapping. This FE-SEM is equipped with a large, analytical sample chamber with multiple ports designed to accommodate a variety of detectors. The FE-SEM includes a large chamber mounted sample stage for easy positioning of large, heavy samples (>2 kilograms (Kg)). The stage supports a total viewing area of samples as large as 177 millimeter (mm) in diameter and is capable of Z-axis movement of 80 millimeter (mm). The FE-SEM chamber includes a high-resolution chamber mounted color camera for sample navigation. The FE-SEM supports both live web viewing and remote control using standard remote desktop applications using a single computer without the need for a support computer to minimize information technology impacts. This SEM compact size does not exceed 2 meters X 2.5 meters and does not require cooling water in its operation to meet facility requirements and room size. The Government intends to acquire this commercial item using FAR Part 12 on a sole-source basis to JEOL USA, Inc. Interested organizations may submit their capabilities and qualifications to perform the effort in writing to the identified point of contact (Shenise.Truesdell@nasa.gov) no later than August 13, 2021 by 12:30 p.m. CST. Such capabilities/qualifications will be evaluated solely for determining whether to conduct this procurement on a competitive basis. A determination by the Government not to compete this proposed effort on a full and open competition basis, based upon responses to this notice, is solely within the discretion of the Government. Oral communications are not acceptable in response to this notice. NASA Clause 1852.215-84, Ombudsman, is applicable. The Center Ombudsman for this acquisition can be found at March 20, 2020, http://prod.nais.nasa.gov/pub/pub_library/Omb.html .