Maintenance of Instruments for Data Collection by Cryo Electron Microscopes
Please see attached redacted Justification & Approval for subject award.
Please see attached redacted Justification & Approval for subject award.
Please see attached intent to sole source synopsis pursuant to FAR section 13.501, in accordance with (IAW) FAR 6.302-1 Only one responsible source and no other supplies or services will satisfy agenc...