Inactive

Scope of Work: Fabrication of 1 CM VUV SiPM Wafers Fifteen (15) 6-inch wafers, to be fabricated in clean-room and containing large-area SiPMs built in VUV-HD technology and optimized for the detection... Scope of Work: Fabrication of 1 CM VUV SiPM Wafers Fifteen (15) 6-inch wafers, to be fabricated in clean-room and containing large-area SiPMs built in VUV-HD technology and optimized for the detection of 178 nm photons. The run will include two sets of wafers with different SiPM layouts, to be finalized and agreed in subsequent technical discussions with Brookhaven National Lab (“BNL” hereafter). The two sets of wafers will be divided as follows: Ten (10) wafers will include SiPMs with an active area of approximately 10x10 mm2 (“SiPM production wafers”); five (5) wafers will include special SiPMs layouts to be used in a subsequent R&D activity. After the fabrication, all the 10x10 mm2 SiPMs included in the “SiPM production wafers”, excluding the test structures, will be tested electrically (forward and reverse IV of each SiPM) and the report of their characterization will be sent to BNL together with the wafers. After the fabrication, a set of electrical tests will be agreed with BNL and executed on the SiPMs and test structures included in the “TSV test wafers”. A report of their characterization will be prepared.