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The basis for the procurement of a dynamic double aberration-corrected scanning transmission electron microscope (Dynamic DAC-STEM) for the Center for Nanoscale Materials (CNM) at Argonne National Lab... The basis for the procurement of a dynamic double aberration-corrected scanning transmission electron microscope (Dynamic DAC-STEM) for the Center for Nanoscale Materials (CNM) at Argonne National Laboratory (ANL). The microscope will be procured by Brookhaven Science Associates (BSA) on behalf of the CNM as part of the Nanoscale Science Research Center Recapitalization (NSRC-Recap) project. The microscope, hereafter referred to as “Instrument”, shall be designed to provide a combination of capabilities for sub-angstrom spatial resolution with simultaneous temporal resolution in the microsecond regime. This microscope is required to provide an atomic-sized probe and accelerating voltages ranging from 30-200kV. The electron microscope shall provide an electrostatic dose modulator capable of ultrafast beam blanking (< 20 ns switching time) and a high-speed imaging detector with frame rates of 100 kHz or better, with exposure times down to 500 ns and less than 100 ns transition time between subframes. This new system will be capable of sub-angstrom spatial resolution with simultaneous temporal resolution in the microsecond regime, which are both important for the understanding of irreversible transient states in materials. BSA invites you to participate in accordance with the RFP letter and all supporting attachments. The proposal due date is October 09, 2022 Any questions concerning this RFP must be addressed via email to the attention of Nick D’Abbraccio (ndabbracc@bnl.gov).