Inactive

ORNL is in need of laser profilers that provide high resolution measurement at a rate up to 1 meter per minute of sub millimeter scale. The ORNL research focuses on the investigation and analysis of s... ORNL is in need of laser profilers that provide high resolution measurement at a rate up to 1 meter per minute of sub millimeter scale. The ORNL research focuses on the investigation and analysis of sub-millimeter topological variations in active and conductive particles under compression, and how these variations influence the long-term performance. Slurry is applied to a conductive substrate that is opaque, limiting the types of sensor modalities available for topology variation data acquisition. This data is a crucial component of a digital platform for advanced battery manufacturing, with the ultimate goal of scaling production to industry standards, where manufacturing rates of 1 meter per minute are expected.