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Fermilab is looking for vendors to provide an atomic force microscope (AFM) that is capable to measure with suitable attachments for advanced material characterization, doping process optimization, as... Fermilab is looking for vendors to provide an atomic force microscope (AFM) that is capable to measure with suitable attachments for advanced material characterization, doping process optimization, as well as layered structures for research on primarily bulk niobium and layered Nb-dielectric metal samples. Genernal purpose of the AFM system is to measure different surface properties from a variety of samples. Combination of these measurement modes in one complete system provides great advantage of live high-resolution evaluation of superconducting samples. Vendors ineterested in providing this equipment should contact the Procurement Specialist list.