The National Synchrotron Light Source II (NSLS-II) at Brookhaven National Laboratory (BNL) is procuring the integration of a low-temperature scanning probe microscope (LT-SPM) into an existing multiprobe UHV surface analysis system. The work includes designing and building a new SPM scanner, sample stage with seven electrical contacts, removable magnetic field assembly, and all internal electronics and cabling, while reusing an existing cryostat. The supplier must ensure full compatibility with the existing Scienta Omicron MATRIX SPM controller and collaborate closely with CFN staff to design a UHV SPM chamber that integrates seamlessly with the current system. Installation and performance testing, including demonstrating atomic resolution for both STM and AFM on Au(111) or graphite, will occur at CFN. No specific budget, submission timelines, or performance location beyond CFN are mentioned.

BSA is procuring the Construction and Integration of a Low-Temperature SPM into a Multiprobe UHV Surface Analysis System. The requirement form and/or function supports the design and construction of a... BSA is procuring the Construction and Integration of a Low-Temperature SPM into a Multiprobe UHV Surface Analysis System. The requirement form and/or function supports the design and construction of a low-temperature scanning probe microscope (LT-SPM) and its integration into the existing multiprobe system without compromising or sacrificing any original system functionality. The LT-SPM will include a new SPM scanner, a sample stage with seven additional electrical contacts, a removable magnetic field assembly, required internal electronics, and all necessary wiring and cabling, while utilizing an existing cryostat previously purchased from the same Supplier for a prior LT-STM system. All SPM cabling will be compatible with the existing Scienta Omicron MATRIX SPM controller. In addition, A UHV SPM chamber will be designed and built by the Supplier in close collaboration with CFN staff to ensure full compatibility with the existing multiprobe system, enabling smooth sample and STM tip transfer between chambers and reliable SPM operation under UHV conditions. The Supplier will install all new components within the cryostat at CFN, including internal electronics, wiring, and cabling, and will perform system performance and quality tests on an Au(111) crystal or graphite surface to demonstrate atomic resolution for both STM and AFM.