Low-Temperature (LT) Scanning Probe Microscope (SPM)
The National Synchrotron Light Source II (NSLS-II) at Brookhaven National Laboratory (BNL) is procuring the integration of a low-temperature scanning probe microscope (LT-SPM) into an existing multiprobe UHV surface analysis system. The work includes designing and building a new SPM scanner, sample stage with seven electrical contacts, removable magnetic field assembly, and all internal electronics and cabling, while reusing an existing cryostat. The supplier must ensure full compatibility with the existing Scienta Omicron MATRIX SPM controller and collaborate closely with CFN staff to design a UHV SPM chamber that integrates seamlessly with the current system. Installation and performance testing, including demonstrating atomic resolution for both STM and AFM on Au(111) or graphite, will occur at CFN. No specific budget, submission timelines, or performance location beyond CFN are mentioned.