Low-Temperature (LT) Scanning Probe Microscope (SPM)

Notice ID:BSA475591

The National Synchrotron Light Source II (NSLS-II) at Brookhaven National Laboratory (BNL) is procuring the integration of a low-temperature scanning probe microscope (LT-SPM) into an existing multiprobe UHV surface analysis system. The work includes designing and building a new SPM scanner, sample stage with seven electrical contacts, removable magnetic field assembly, and all internal electronics and cabling, while reusing an existing cryostat. The supplier must ensure full compatibility with the existing Scienta Omicron MATRIX SPM controller and collaborate closely with CFN staff to design a UHV SPM chamber that integrates seamlessly with the current system. Installation and performance testing, including demonstrating atomic resolution for both STM and AFM on Au(111) or graphite, will occur at CFN. No specific budget, submission timelines, or performance location beyond CFN are mentioned.

LT-SPM

Inactive
Notice ID:BSA475591

BSA is procuring the Construction and Integration of a Low-Temperature SPM into a Multiprobe UHV Surface Analysis System. The requirement form and/or function supports the design and construction of a...

Department/Ind.Agency Subtier Office
ENERGY, DEPARTMENT OF ENERGY, DEPARTMENT OF BROOKHAVEN NATL LAB -DOE CONTRACTOR
  PSC   6640 LABORATORY EQUIPMENT AND SUPPLIES
LOCATION: Not Given
Primary Contact
Mark Brock
631-***-2713

Links (0)

Attachments (0)


Data sourced from SAM.gov. View Official Posting »