Request for Quote: Low Vacuum Scanning Electron Microscope and X-ray Microanalysis System

Inactive
Notice ID:89243320QEE000007

Request for Quote: Low Vacuum Scanning Electron Microscope and X-ray Microanalysis System - Amendment 001 to extend the due date of the RFQ

Department/Ind.Agency Subtier Office
ENERGY, DEPARTMENT OF ENERGY, DEPARTMENT OF NATIONAL ENERGY TECHNOLOGY LABORATORY
NAICS 333314 - Optical Instrument and Lens Manufacturing
  PSC   6640 LABORATORY EQUIPMENT AND SUPPLIES


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Notification