Field-Emission Scanning Electron Microscope (FE?SEM) System
Argonne National Laboratory seeks to procure the installation and testing of a Field-Emission Scanning Electron Microscope (FE-SEM) system. The proposal must include two priced configurations: a Base System and a Base System with an optional Ultra-Fast Beam Blanker. Vendors must provide detailed information on lead time, shipping origin, and accepted Incoterms, specifying DAP for international shipments and FOB Destination for domestic ones, with the quoted price being final. The performance location is Argonne National Laboratory. Questions must be submitted by January 26, 2026, at 12:00 PM CST.