Reflectometer or Ellipsometer

Inactive
Notice ID:336367-MTC

FRA SEEKS QUOTATIONS FOR THE FOLLOWING: Reflectometer or Ellipsometer with Requirements: Thickness: measurement of films > 40nm Software: solve for multi-layer stacks (at least 20). Wavelength: 200nm ...

Department/Ind.Agency Subtier Office
ENERGY, DEPARTMENT OF ENERGY, DEPARTMENT OF FERMILAB - DOE CONTRACTOR
  PSC   PHYSICAL PROPERTIES TEST EQ


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