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Argonne National Laboratory is looking to source one (1) Profilometer with the following specifications. Camera: Sampling Viewing Side view camera: 2.5mm x 4.25mm; Top down camera: 11.5mm x 15.5mm Waf... Argonne National Laboratory is looking to source one (1) Profilometer with the following specifications. Camera: Sampling Viewing Side view camera: 2.5mm x 4.25mm; Top down camera: 11.5mm x 15.5mm Wafer Vacuum Chuck Package (Includes 3 WVCs - 2 - 3", 4 - 6" and 8") Nlite+ Low Force Measurement Capability This low force option extends the standard force range below 1mg to 0.030mg for use on sensitive materials using precision closed loop feedback Motorized X/Y stage with 6" x 6" (150x150mm) of travel, motorized 360-degree rotation - includes 2-3, 4-6, or 8" vacuum chuck as standard with the system. - LIS 3, low inertia sensor with 1 to 15mg of force - Exclusive quick-change stylus technology. Re-calibration not required when exchanging styli. - High-resolution digital color camera with selectable magnification - Starter stylus (choose 2um) - Optically flat scan block with 55mm scan length - 4 angstrom step height repeatability, 1 sigma on 1,000 angstrom step - Automatic stitching for up to 200mm scans - 3D map collection and extensive data analysis Please provide with your quotation: Signed Page one of the RFQ (ANL-70) Email acceptance of applicable terms and conditions (ANL-71COM) Completed ANL Reps and Certs (PD-159) Published Price List or Redacted Invoice Country of Origin for quoted items Provide your best lead time after receipt of the order. Provide any available discounts. (If GSA pricing is available, include contract # and expiration date).