One (1) Benchtop Scanning Electron Microscope capable of high-resolution imaging and spectroscopic characterization via energy-dispersive spectroscopy, equipped with a secondary electron detector (SED) and a back-scattered electron detector (BSE)

Inactive
Notice ID:W911WX24Q0234

COMBO SYNOPSIS SOLICITATION FOR COMMERCIAL ITEMS 1. Class Code: 66 2. NAICS Code: 334516 3. Subject: One (1) Benchtop Scanning Electron Microscope capable of high-resolution imaging (350,000 times (X)...

Department/Ind.Agency Subtier Office
DEPT OF DEFENSE DEPT OF THE ARMY W6QK ACC-APG ADELPHI
  PSC   OPTICAL INSTRUMENTS, TEST EQUIPMENT, COMPONENTS AND ACCESSORIES


Data sourced from SAM.gov. View Official Posting »

Sources Sought for: One (1) Benchtop Scanning Electron Microscope capable of high-resolution imaging (350,000 times (X) magnification with greater than (<)10 resolution)

Inactive
Notice ID:W911WX24Q0234

Sources Sought Instructions Sources Sought Template: (1) Action Code : SOURCES SOUGHT This is a Sources Sought Notice only. This is not a request for proposal, but a survey to locate potential sources...

Department/Ind.Agency Subtier Office
DEPT OF DEFENSE DEPT OF THE ARMY W6QK ACC-APG ADELPHI
  PSC   OPTICAL INSTRUMENTS, TEST EQUIPMENT, COMPONENTS AND ACCESSORIES


Data sourced from SAM.gov. View Official Posting »