Maintenance for FEI Helios 600i Focused Ion Beam / Scanning Electron Microscope for Benet Labs, Watervliet, NY

Inactive
Notice ID:W911PT21Q0066

To cover the cost of Focused Ion Beam/SEM Maintenance per Scope of Work for a base and an option year. Service Contract Labor Standards 15-4143 Rev 17 apply and are incorporated. Note: Procurement is ...

Department/Ind.Agency Subtier Office
DEPT OF DEFENSE DEPT OF THE ARMY W6QK ACC WVA
  PSC   MAINT-REP OF SP INDUSTRY MACHINERY


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