Maintenance for FEI Helios 600i Focused Ion Beam / Scanning Electron Microscope for Benet Labs, Watervliet, NY
W911PT21Q0066
To cover the cost of Focused Ion Beam/SEM Maintenance per Scope of Work for a base and an option year. Service Contract Labor Standards 15-4143 Rev 17 apply and are incorporated. Note: Procurement is ...