Inactive

Statement of Work Maintenance of FEI Helios FIB/SEM Dual Beam 1. Background: 1.1 Benet Labs' FEI Helios 600A Focused Ion Beam / Scanning Electron Microscope is a scientific instrument that combines th... Statement of Work Maintenance of FEI Helios FIB/SEM Dual Beam 1. Background: 1.1 Benet Labs' FEI Helios 600A Focused Ion Beam / Scanning Electron Microscope is a scientific instrument that combines the imaging capabilities of a scanning electron microscope (SEM) with the micro-machining capabilities of a focused ion beam system (FIB). The dual-beam allows the Lab to characterize cutting edge materials, including nano-structured and non-metallic designs, composite structures, atomic-scale materials, and non-metallic coatings in-house. In order to maintain the quality, reliability, and accuracy of the instrument, periodic maintenance is required. 2. Applicable Documents: None. 3. Scope/Objective: 3.1 Provide maintenance, support, repair and software updates to FEI Helios 600A FIB/SEM Dual Beam. 4. Requirements: 4.1 Contractor shall provide maintenance service to include 1PM per year, calibration to factory specification, OEM replacement parts, as available, labor, materials, repairs, support, and software updates where necessary on the following items: 4.1.1 Helios Nanolab 600A, S/N 9921883 4.1.2 FEI Easylift, S/N 9921883.1 4.1.3 Pt Deposition, S/N 9921883.2 4.1.4 ICE Detector, S/N 9921883.3 4.1.5 STEM Detector 4.1.6 NavCam 4.1.7 xT Control Equipment 4.2 Contractor shall not be required to provide consumable items such as, but not limited to: 4.2.1 Final Apertures 4.2.2 Scintillators 4.2.3 Filaments 4.2.4 Ion Sources 4.3 Contractor's targeted response time for service call(s) shall be 48 hours after being notified of equipment problem or failure. FEI shall provide telephone support for repair and maintenance of the Equipment during FEI business hours (Monday through Friday, 8:00 am - 5:00 pm, based on the time zone in which the Equipment is located, exclusive of FEI holidays). 5. QASP: Performance Objectives Reference Acceptable Quality Level (AQL) Method of Surveillance Provide 1 PM per year Para. 4.1 100% Feedback from the Technical POC. Response for service calls shall be 48 hours after notification of problems Para. 4.3 98% Feedback from the Technical POC for each service call. 6. Special Requirements 6.1 Accounting for Contract Service: 6.1.1 The contractor shall report ALL contractor labor hours (including subcontractor labor hours) required for performance of services provided under this contract for the [FEI Helios FIB/SEM Dual Beam] via a secure data collection site. The contractor is required to completely fill in all required data fields using the following web address: https://www.ecmra.mil 6.1.2 Reporting inputs will be for the labor executed during the period of performance during each Government fiscal year (FY), which runs October 1 through September 30. While inputs may be reported any time during the FY, all data shall be reported no later than October 31 of each calendar year, beginning with 2019. Contractors may direct questions to the help desk at: https://www.ecmra.mil 7. Options: 7.1 Benet Labs shall be able to procure an FEI Part ‘Aperture Holder,' Part Number 402226802026 during the year 1 April 2019 - 31 March 2020. 8. Period of Performance on this maintenance contract shall be for one (1) year, 1 April 2019 through 31 March 2020. 9. Benet Technical Point of Contact is Stephen Smith, (518) 266-5359. 10. Information Disclosure: A Certificate of Non-Disclosure shall be signed by all contractor employees working under this effort and returned to the COR prior to award. The contractor shall not release any information or data without the approval of the Government.