Inactive

To facilitate coating analysis and characterization associated with hexavalent chromium elimination efforts, the Government requires a Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS) with de... To facilitate coating analysis and characterization associated with hexavalent chromium elimination efforts, the Government requires a Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS) with depth profiling and MS/MS capabilities and two (2) analysis workstations with all required software licenses. The TOF-SIMS is to be installed at DEVCOM AC WSEC Benet Laboratories. Installation and on-site training shall be performed by the system manufacturer. The period of performance of the contract shall commence upon award of the contract and shall be completed upon delivery and installation of the TOF-SIMS, which shall occur within 300 days from award of the contract. Please see the attached Combined Synopsis and Soliciationwith attachment for further details.