APPLICATION SUPPORT FOR THE TERADYNE MICROFLEX SEMICONDUCTOR TEST SYSTEM

Inactive
Notice ID:N0016419Q0173

N00164-19-Q-0173 - SOLE SOURCE - APPLICATION SUPPORT FOR THE TERADYNE MICROFLEX SEMICONDUCTOR TEST SYSTEM - FSG J066 - NAICS 541990 ISSUE DATE 16 APR 2019 - CLOSING DATE 30 APR 2019 - 4:00 PM Eastern ...

Department/Ind.Agency Subtier Office
DEPT OF DEFENSE DEPT OF THE NAVY NSWC CRANE
  PSC   MAINT, REPAIR, REBUILD EQUIPMENT
LOCATION:

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Data sourced from SAM.gov. View Official Posting »

APPLICATION SUPPORT FOR THE TERADYNE MICROFLEX SEMICONDUCTOR TEST SYSTEM

Inactive
Notice ID:N0016419Q0173

N00164-19-Q-0173 - SOLE SOURCE - APPLICATION SUPPORT FOR THE TERADYNE MICROFLEX SEMICONDUCTOR TEST SYSTEM - FSG J066 - NAICS 541990 ISSUE DATE 16 APR 2019 - CLOSING DATE 30 APR 2019 - 4:00 PM Eastern ...

Department/Ind.Agency Subtier Office
DEPT OF DEFENSE DEPT OF THE NAVY NSWC CRANE
  PSC   MAINT, REPAIR, REBUILD EQUIPMENT
LOCATION:

Links ()

Attachments ()


Data sourced from SAM.gov. View Official Posting »