AFIT, Air Force Institute of Technology, has a requirement for a new Field Emission Scanning Electron Microscope. This FE-SEM will be used to support student thesis work by providing journal quality imagery and data analysis.

Inactive
Notice ID:FA8601-19-R-SABK

FE-SEM Microscope Sources Sought- The Government is conducting market research and identifying, as potential sources, companies that may possess the expertise, capabilities, and experience to meet the...

Department/Ind.Agency Subtier Office
DEPT OF DEFENSE DEPT OF THE AIR FORCE FA8601 AFLCMC PZIO
  PSC   INSTRUMENTS AND LABORATORY EQPT
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