NIST seeks market research information for a specialized detector system to enhance semiconductor supply chain analysis. The required solution includes a vacuum-compatible TPX3 detector for a scanning electron microscope, a manual retract mechanism, and installation/training services. The work supports the CHIPS project to evaluate 2D material-based device reliability. No specific budget, performance location, or non-bid/proposal timelines are detailed in the description. Respondents must provide detailed capability and product information without submitting proprietary data.