This is a sources sought notice for market research to identify potential suppliers of a micro X-ray Computed Tomography (µXCT) system for NIST's Precision Imaging Facility to support semiconductor research. The system must image millimeter-scale specimens with nanometer resolution, featuring specific technical requirements like a 500 nm spatial resolution and a 160 kV X-ray source. Performance of services will occur at a NIST facility, as the instrument must fit within a defined laboratory space of 23 feet by 23 feet with a 13-foot ceiling height. The notice requests detailed capability statements from companies, including technical specifications, support services, and pricing information. No budget or specific procurement timelines are provided in this market research phase.