The National Institute of Standards and Technology (NIST) is seeking sources for a piezoelectric z-stage upgrade for a Zeiss Axio Observer 7 microscope to support CHIPS Metrology projects. The upgrade must integrate with the existing x-y stage, be controlled by Zeiss Zen software, and meet specifications including a 500-micrometer travel range, 1 nm resolution, and ±5 nm reproducibility. NIST intends to sole source this requirement to Carl Zeiss Microscopy LLC unless alternative sources are identified through this market research. The location for performance is at NIST, and no budget amount is specified. Responses are requested as soon as possible, with questions due 5 calendar days before the response date.