NIST is seeking information from potential sources capable of providing three custom optical lens doublets for a microscope assembly used to measure visible light from EUV scintillator materials, supporting semiconductor metrology. The lenses must be designed specifically for an optical microscope to characterize scintillator performance in EUV lithography. No specific budget amount, submission timeline, or performance location is mentioned in this sources sought notice. Respondents should provide company details, product specifications, customization capabilities, and pricing information via email to the primary contact. This notice is for market research only and does not constitute a solicitation or commitment to award a contract.