NIST seeks an optical microscope system for inspecting 200mm semiconductor wafers to characterize defects as part of research into new computing hardware. The system must be a new, integrated unit capable of 100X magnification and include a motorized stage and software for image stitching, with detailed specifications for objectives, illumination, camera, and controls. The performance location is the NIST NanoFab or through research partnerships. There is a preference for systems weighing less than 65 kg. Questions regarding the notice are due by 5:00 p.m. Eastern Time on March 20, 2026.