This is a market research notice from NIST seeking an ion milling system to prepare transmission electron microscope specimens in support of the CHIPS for America Act. The system must meet detailed technical requirements, including holding standard 3mm grids, having two independently adjustable ion sources, and including a microscope for imaging during milling. The notice requests comprehensive information from potential suppliers about their products, capabilities, terms, and pricing. No specific budget, performance location, or non-bid/proposal timelines are mentioned in the description.