Sources Sought Notice for Copper See-through Wafer for SEM-based Overlay Metrology

Inactive
Notice ID:NIST-SS25-CHIPS-0042

The purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government’s anticipated needs. BACKGROUND The N...

Department/Ind.Agency Subtier Office
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY DEPT OF COMMERCE NIST
  PSC   LABORATORY EQUIPMENT AND SUPPLIES


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