Scanning Threshold Particle Counter (STPC)

Inactive
Notice ID:NIST-SS25-CHIPS-0016

Semiconductor manufacturing yield enhancement requires ongoing risk analysis of cleaning chemical purity wherein critical contaminants are already at levels difficult or impossible to detect, let alon...

Department/Ind.Agency Subtier Office
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY DEPT OF COMMERCE NIST
  PSC   LABORATORY EQUIPMENT AND SUPPLIES


Data sourced from SAM.gov. View Official Posting »