Nano-scanning mobility particle sizer (nano-SMPS)

Inactive
Notice ID:NIST-SS25-CHIPS-0001

BACKGROUND Semiconductor manufacturing yield enhancement requires ongoing risk analysis of cleaning chemical purity wherein critical contaminants are already at levels difficult or impossible to detec...

Department/Ind.Agency Subtier Office
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY DEPT OF COMMERCE NIST
  PSC   LABORATORY EQUIPMENT AND SUPPLIES
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