CHIPS XAFS and Diffraction, Silicon Drift Detector

Inactive
Notice ID:NIST-SS24-CHIPS-0046

BACKGROUND This project involves an existing NIST Synchrotron beamline at the National Synchrotron Light Source II (NSLS-II) and an existing CRADA with IBM. It’s purpose is to improve the X-ray Absorp...

Department/Ind.Agency Subtier Office
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY DEPT OF COMMERCE NIST
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