Suite of Analytical Detectors for Focused Ion Beam and Scanning Electron Microscopes

Inactive
Notice ID:NIST-SS23-CHIPS-0027

This is a sources sought notice. Please see attachment NIST-SS23-CHIPS-0027 for complete notice details.

Department/Ind.Agency Subtier Office
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY DEPT OF COMMERCE NIST
NAICS 334516 - Analytical Laboratory Instrument Manufacturing
  PSC   LABORATORY EQUIPMENT AND SUPPLIES
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