Suite of Scanning Electron and Focused Ion Beam Microscopes

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Notice ID:NIST-SS23-CHIPS-0025

THIS IS A SOURCES SOUGHT NOTICE PLEASE SEE ATTACHMENT NIST-SS23-CHIPS-0025 AND APPLICABLE PDF Focused Ion Beam Lab Layout (81-1C109).pdf FOR COMPLETE NOTICE DETAILS ...

Department/Ind.Agency Subtier Office
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY DEPT OF COMMERCE NIST
NAICS 334516 - Analytical Laboratory Instrument Manufacturing
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