Focused Ion Beam Scanning Electron Microscope (FIB/SEM) System

Inactive
Notice ID:NIST-SS23-CHIPS-0001

THIS IS A SOURCES SOUGHT NOTICE PLEASE SEE THE ATTACHMENT NIST-SS23-CHIPS-0001 FOR THE COMPLETE NOTICE DETAILS...

Department/Ind.Agency Subtier Office
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY DEPT OF COMMERCE NIST
NAICS 334516 - Analytical Laboratory Instrument Manufacturing
  PSC   LABORATORY EQUIPMENT AND SUPPLIES


Data sourced from SAM.gov. View Official Posting »

Notification