Thermal Field Emission Scanning Electron Microscope Platform for Automated Particle Analysis

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Notice ID:NIST-MML-24-SS03

Document Type: Sources Sought Notice Notice Number: NIST-MML-24-SS03 Title: Thermal Field Emission Scanning Electron Microscope Platform for Automated Particle Analysis NAICS Code: 334516 Contracting ...

Department/Ind.Agency Subtier Office
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY DEPT OF COMMERCE NIST
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