Used Focused Ion Beam Scanning Electron Microscope (FIB/SEM) System

Inactive
Notice ID:NIST-MML-22-SS09

Sources Sought Notice NIST-MML-22-SS09 Title: Used Focused Ion Beam Scanning Electron Microscope (FIB/SEM) System This is a Sources Sought Notice ONLY. Requests for copies of a solicitation will not r...

Department/Ind.Agency Subtier Office
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY DEPT OF COMMERCE NIST
NAICS Not provided
  PSC   (blank)


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