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THIS IS A SOURCES SOUGHT NOTICE. PLEASE SEE ATTACHMENT FOR COMPLETE NOTICE DETAILS AND SUBMISSION INSTRUCTIONS. GENERAL DESCRIPTION: High Power, High Repetition Rate Laser System for Terahertz Spectro... THIS IS A SOURCES SOUGHT NOTICE. PLEASE SEE ATTACHMENT FOR COMPLETE NOTICE DETAILS AND SUBMISSION INSTRUCTIONS. GENERAL DESCRIPTION: High Power, High Repetition Rate Laser System for Terahertz Spectroscopy and Imaging The National Institute of Standards & Technology (NIST) seeks information on vendors that can provide a commercial compact high-repetition rate, high-power femtosecond laser system for Terahertz (THz) thermal IC imaging and Near-Field Scattering-Optical Microscopy (s-SNOM). The system shall provide sufficient pulse power for THz probe generation and detection up to MHz repetition rates to achieve highest signal-to-noise capability for pump-probe and carrier dynamics measurements. Includes an Optical Parametric Amplifier (OPA) for tunable visible, ultraviolet and/or mid-IR pulse generation for transient absorption and fluorescence and related ultrafast spectroscopy experiments. Terahertz imaging and spectroscopy projects fall within the Nanoscale Device Characterization Division mission by providing novel measurement capabilities for 3D integrated circuits and optically determine carrier dynamics and mobility of nanoscale material features. These measurements complement other nanoscale metrologies but will advance non-contact carrier information and thermal properties within device structures. NIST is seeking information from sources that may be capable of providing a commercial item solution that meets or exceeds the draft minimum specifications in the attached.