NIST is conducting market research to identify capable and interested sources for one scanning Microwave Impedance Microscopy (sMIM) electronic controller to support nanoscale impedance measurements with a government-owned Vero Atomic Force Microscope. The controller must integrate with the existing ScanWave 2.0™ Probe Interface module, replace the current modular microwave electronics assembly, and provide approximately a tenfold sensitivity improvement while supporting existing multimodal characterization capabilities. It must also preserve current system functionality, include the manufacturer’s standard