Combined Sources Sought Notice and Notice of Intent to Award a Sole Source Contract for ScanWave Pro electronic controller for a Vero AFM

Notice ID:NB643090-26-01166

NIST intends to negotiate on a sole source basis with PrimeNano Inc. for one ScanWave Pro electronic controller to replace aging electronics in its existing scanning Microwave Impedance Microscopy (sMIM) module integrated with an Oxford Instruments/Asylum Research Vero Atomic Force Microscope. The required system must be fully compatible with the Government-owned Vero AFM and existing ScanWave 2.0™ Probe Interface, including hardware, software, reflectometer, calibration sample, documentation, installation, and training for up to two NIST personnel. Delivery of equipment, software, and documentation is required within 60 calendar days after award, with installation and integration completed within 10 calendar days after delivery, and training also completed within that same 10-day window. No solicitation package will be issued, but responsible sources may submit a written capability statement demonstrating their ability to meet the full requirement, including compatibility, sMIM functionality, Windows 11 software support, and installation/training timelines. The applicable NAICS code is 334515 with a small business size standard of 750 employees.

Department/Ind.Agency Subtier Office
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY DEPT OF COMMERCE NIST
  PSC   6625 ELECTRICAL AND ELECTRONIC PROPERTIES MEASURING AND TESTING INSTRUMENTS
LOCATION: Not Given
Primary Contact
Rudolph Spencer
Not Given

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Data sourced from SAM.gov. View Official Posting »

Combined Sources Sought Notice and Notice of Intent to Award a Sole Source Contract for ScanWave Pro electronic controller for a Vero AFM

Inactive
Notice ID:NB643090-26-01166

NIST is conducting market research to identify capable and interested sources for one scanning Microwave Impedance Microscopy (sMIM) electronic controller to support nanoscale impedance measurements with a government-owned Vero Atomic Force Microscope. The controller must integrate with the existing ScanWave 2.0™ Probe Interface module, replace the current modular microwave electronics assembly, and provide approximately a tenfold sensitivity improvement while supporting existing multimodal characterization capabilities. It must also preserve current system functionality, include the manufacturer’s standard

Department/Ind.Agency Subtier Office
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY DEPT OF COMMERCE NIST
  PSC   ELECT ELECTRONIC MEASURING INSTRUMT
LOCATION: Not Given
Primary Contact
Rudolph Spencer
Not Given

Links (0)

Attachments (0)


Data sourced from SAM.gov. View Official Posting »