Field-Emission Scanning Electron Microscope (FE-SEM) with Electron Backscatter Diffraction (EBSD) and Energy Dispersive Spectroscopy (EDS) Detectors and Analytical Software.
This is a sources sought notice for market research, not a solicitation, from the National Institute of Standards and Technology (NIST) for a high-resolution analytical Field-Emission Scanning Electron Microscope (FE-SEM) with EDS and EBSD detectors. The required scope includes delivery, installation, validation, training, a one-year warranty, and three optional one-year extended maintenance periods. The NAICS code is 334516 with a 1000-employee small business size standard. No budget amount is specified, and the location for performance is not mentioned. Responses are voluntary, and no solicitation documents exist at this time.