Replacement Cesium Source Head for a Secondary Ion Mass Spectrometry Instrument

Notice ID:NB573063-27-0001

NIST intends to negotiate a sole-source, urgent replacement of a non-functional Cesium Source Head for its time-of-flight secondary ion mass spectrometry (ToF-SIMS) instrument with ION-TOF USA, Inc. of Chestnut Ridge, New York. Market research and ION-TOF’s written statement indicate that ION-TOF is the only authorized and capable provider of service and spare parts for IONTOF surface analysis equipment, including TOF-SIMS IV instruments. The applicable NAICS code is 334516 (Analytical Laboratory Instrument Manufacturing), with a 1,000-employee small-business size standard. No solicitation package will be issued, but interested parties who believe they can fulfill the requirement may submit responses for Government consideration.

Department/Ind.Agency Subtier Office
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY DEPT OF COMMERCE NIST
NAICS Not provided
  PSC   6640 LABORATORY EQUIPMENT AND SUPPLIES
LOCATION: Not Given
Primary Contact
Erik Frycklund
Not Given

Links (0)

Attachments (0)


Data sourced from SAM.gov. View Official Posting »