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The National Institute of Standards and Technology (NIST) Biophysics and Biomedical Measurements Group (681.05) requires a probe station for characterizing CMOS devices designed for biophysical measur... The National Institute of Standards and Technology (NIST) Biophysics and Biomedical Measurements Group (681.05) requires a probe station for characterizing CMOS devices designed for biophysical measurements. This probe station will be used for parametric characterization of devices enabling new signal test capabilities to interrogate and validate novel electronic devices custom-built for biology. The probe station will be used for DC and low frequency measurements of < 10 MHz. The system will support two types of test classes, current vs. voltage (IV) at DC and capacitance vs. voltage (CV) measurements at frequencies < 10 MHz. The probe station operation shall be semi-automated, for example including at minimum a motorized stage and associated machine vision, scripting and automation tools that can repeat test programs across single die or up to an entire 200 mm diameter wafer in a predetermined path. This capability assumes that the layout of the device pads remains constant relative to each other. The system should also be programmable (and scriptable, e.g., with Python) to repeat measurements of multiple test structures within a single die by moving a fixed distance from the initial position, assuming the pad layout of each structure remains constant. Critically, to account for the additional sensitivity of biological chips and unique chip structures that may include fluidic layers, the system must have the ability to detect potential collisions and halt actuation of all moving components. This includes the ability to define custom exclusion zones in software. NIST is seeking information from sources that may be capable of providing a probe station that meets or exceeds the following draft minimum specifications: One (1) 200 mm semi-automatic probe station that meet the following minimum specifications: Chuck: The probe station must include an ambient temperature (or non-thermal) chuck that supports single dies, shards and wafers up to 200 mm diameter. Vacuum zones: 4 or more to allow attachment of samples as small as 10 mm and up to a 200 mm wafer. Vacuum zones must be individually controllable. Temperature range: Non-thermal ambient Electrical connection: Triaxial Electrical leakage: < 25 fA. Planarity: < 25 mm at room temperature (25 deg C) Auxiliary chuck: Single auxiliary steel chuck that supports a sample size of 10 mm ´ 10 mm, for example, to allow probe cleaning. Sample loading: The probe station shall include a roll out chuck for easy sample loading and to prevent accidental damage to samples or probes. The probe station shall support future automation needs such as automated wafer loaders. Light Shielding: Complete light shielding of sample chuck with > 100 dB attenuation. Platen: An integrated fixed platen is required with the following specifications: Probe positioners: Support 8 or more DC probe positioners. Platen mount: Fixed Material: Steel to support magnetic probe positioners. Platen interface: Top hat that supports 8 or more manual DC probes simultaneously and provides shielding from electromagnetic interference (EMI). Sample Stage: Motorized 4-axis stage with X, Y, Z and q with the following performance specifications: X and Y axis: Resolution: £ 0.25 mm. Travel range: 200 mm or greater. Z-axis: Resolution: £ 1 mm. Travel range: 25 mm or greater. Rotation q: Resolution: £ 1 mm Range: ³ ± 5 degrees Probe Station Control: Must include PC and all control software for sample stage and all motorized components. Required interface: GPIB for test instrumentation control Require interface: USB for instrument control Software: Software with graphical user interface for system operation Scripting: The probe station control software shall work in tandem with the machine vision system (CLIN002) to allow the ability to script system functions to allow custom test programs. Scripting in Python, C or equivalent is required. The probe station control software shall work in tandem with the machine vision system (CLIN002) to be programmable to repeat measurements of multiple test structures within a single die by moving a fixed distance from the initial position, assuming the pad layout of each test structure remains constant. Operating System: Windows 10 to ensure network compatibility. Vibration Isolation Platform: The system must include actively damped vibration isolation platform. Type: Air-damped vibration isolation system Feet: Leveling feet for installation in final location. b) One (1) microscope and machine vision system with the following minimum specifications: Optical magnification: 10´ or greater. Camera system resolution: 10 megapixels or higher. Illumination: Integrated Light Emitting Diode (LED) illumination. Microscope Mount/Bridge: Integrated microscope mount or bridge with the following specifications: Travel along X and Y axes: > 25 mm. Travel along Z axis: > 50 mm. Microscope motion: Manual Focus: Motorized automatic image focus and refocus with sample height variations. Software: The microscope-based vision system must provide software that is integrated with the probe station and have the following features: Pattern recognition to detect features such as probe pads and work in tandem with the probe station control (CLIN001) to step across dies in a single wafer to repeat measurements. The machine vision software shall work in tandem with the probe station control (CLIN001) to include crash or collision avoidance as a standard feature to avoid contact probes and microscope objective. The crash detection feature must include the ability to define exclusion zones for additional safety. c) Four (4) probe positioners, probe arms and probe tips to support IV and CV that meet the following minimum specifications: Attachment: Magnetic or vacuum. Positioning: Three axis X, Y, and Z Travel: > 10 mm along each axis Resolution: £ 1 mm Probe connections: triaxial. Probe tip size: 5 mm radius. Probe frequency: DC to >50 MHz. Probe current leakage: <5 fA. Isolation: 10 TW or greater Modularity: Probe holder should be modular and allow upgrades to higher performing probes in the future without requiring a full replacement of positioners. HOW TO RESPOND TO THIS NOTICE In responding to this notice, please DO NOT PROVIDE PROPRIETARY INFORRMATION. Please include only the following information, readable in either Microsoft Word 365, Microsoft Excel 365, or .pdf format, in the response: Submit the response by email to the Primary Point of Contact and, if specified, to the Secondary Point of Contact specialist listed at the bottom of this notice as soon as possible, and preferably before the closing date and time of this notice. Provide the complete name of your company, address, name of contact for follow-up questions, their email, their phone number and, if your company has an active registration in https://sam.gov, your company’s Unique Entity ID (UEI). Identify laboratory equipment that your company sells that is of the nature addressed in the BACKGROUND section of this notice. Include brand name, make, model, and/or other distinguishing information. State if your company is the manufacturer of the identified equipment or is a retailer or wholesaler that normally sells the identified equipment. If the latter, indicate whether the manufacturer authorized in writing for your company to sell the identified equipment on behalf of the manufacturer. Describe performance capabilities and relevant or beneficial physical and functional features for any equipment you identified to satisfy the NIST-identified minimum specifications described in this notice. Identify any aspects of the NIST market research notice, including instructions, and draft minimum specifications in the BACKGROUND section above that could be viewed as unduly restrictive or contain unnecessary barriers that adversely affect your ability to fully participate and indicate why. In such a scenario, please offer suggestions for how the market research notice and draft minimum specifications could be made more inclusive and competitive. Discuss whether the equipment that your company sells and which you describe in your response to this notice may be customized to specifications and indicate any limits to customization. For the NAICS code listed in this notice: Indicate whether your company is (a) a small business or (b) other than small business. See the Table of Small Business Size Standards and the associated .pdf download file for small business size standards and additional information. If you believe the NAICS code listed in this notice is not the best NAICS code for the type of product addressed in this notice, identify an alternative NAICS code that you believe would be more appropriate for the planned procurement. Describe services that are available with the purchase of the aforementioned equipment from your company such as installation, training, and equipment maintenance. Describe standard terms and conditions of sale offered by your company for the aforementioned equipment such as: delivery time after your company accepts the order; FOB shipping terms: manufacturer warranty (including details regarding nature and duration); if available, description(s) of available extended warranty; equipment setup and test; operator and service instruction manual(s); cleanup after installation; and if applicable, other offered services. Provide a copy of manufacturer standard terms and conditions that typically relate to the sale of the specified equipment, if available. State whether your company offers facility renovation services related to installation of the aforementioned equipment at its delivery destination, if required per the NIST-identified minimum specifications, and provide description of services. Indicate if your company performs the facility renovation services or typically subcontracts the work to another company. Indicate if your company would be interested inspecting the intended installation site during the market research phase. State published price, discount or rebate arrangements for aforementioned equipment and/or provide link to access company’s published prices for equipment and services. State whether the aforementioned equipment is manufactured in the United States and, if not, state the name of the country where the equipment is manufactured. Identify any plans/possibilities for changes in manufacturing location of the aforementioned equipment and provide relevant details. If the aforementioned equipment and related services are available for purchase on any existing Federal Supply Schedule contract(s) or other contracts against which NIST may be able place orders, identify the contract number(s) and other relevant information. Identify any customers in the public or private sectors in which you provided the aforementioned or similar equipment. Include customer(s) information: company name, phone number, point of contact, email address. Provide any other information that you believe would be valuable for NIST to know as part of its market research for this requirement. State if you require NIST to provide additional information to improve your understanding of the government’s requirement and/or would like to meet with NIST representatives to discuss the requirement and the capabilities of the identified equipment. QUESTIONS REGARDING THIS NOTICE Questions regarding this notice may be submitted via email to the Primary Point of Contact and the Secondary Point of Contact listed in this notice. Questions should be submitted so that they are received by 9:00 a.m. Eastern Time on July 29, 2024. Questions will be anonymized and answered via sources sought notice amendment following the question submission deadline. IMPORTANT NOTES The information received in response to this notice will be reviewed and considered so that NIST may appropriately solicit for its requirements in the near future. This notice should not be construed as a commitment by NIST to issue a solicitation or ultimately award a contract. Responses will not be considered as proposals or quotations. No award will be made as a result of this notice. NIST is not responsible for any costs incurred by the respondents to this notice. NIST reserves the right to use information provided by respondents for any purpose deemed necessary and appropriate. Thank you for taking the time to submit a response!