Atomic Force Microscope platform with large sample stage and electrical scanned probe modes

Inactive
Notice ID:AMD-SS20-12

Atomic Force Microscope platform with large sample stage and electrical scanned probe modes

Department/Ind.Agency Subtier Office
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY DEPT OF COMMERCE NIST
NAICS 334516 - Analytical Laboratory Instrument Manufacturing
  PSC  


Data sourced from SAM.gov. View Official Posting »

Notification