Atomic Force Microscope for use in a Scanning Electron Microscope

Inactive
Notice ID:1333ND26QNB030045

Please see attached combined synopsis/solicitation.

Department/Ind.Agency Subtier Office
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY DEPT OF COMMERCE NIST
NAICS 334516 - Analytical Laboratory Instrument Manufacturing
  PSC   LABORATORY EQUIPMENT AND SUPPLIES


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Notification