Dual Beam Focused Ion Beam / Scanning Electron Microscope System

Inactive
Notice ID:1333ND22QNB640507

AMENDMENT 0002 SEE ATTACHED REVISED SYNOPSYS/SOLICITATION, STATEMENT OF REQUIREMENTS, PROVISIONS AND CLAUSES SUBMITTAL DATE EXTENDED TO 9/15/22 ALL PREVIOUS VERSIONS ARE SUPURSEDED AMENDMENT 0001 REVI...

Department/Ind.Agency Subtier Office
COMMERCE, DEPARTMENT OF NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY DEPT OF COMMERCE NIST
  PSC   LABORATORY EQUIPMENT AND SUPPLIES


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